Title :
A high-efficiency DC-DC buck converter for sub-3×VDD power supply
Author :
Sung, Gang-Neng ; Wang, Ching-Lin ; Jui, Ping-Chang ; Wang, Chua-Chin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
This paper presents a DC-DC step-down converter, which can accommodate the range of input voltage from VDD to sub-3×VDD voltage. By utilizing stacked power MOSFETs, a voltage level converter, a detector and a controller, the proposed design is realized by a typical 1P6M 0.18 μm CMOS process without using any high voltage process to resolve gate-oxide reliability and leakage current problems. The core area is less than 0.184 mm2, while the VDD range is up to 5 V. Since the internal reference voltage is 1.0 V, it can increase the output regulation range. The proposed design attains very high conversion efficiency to prolong the life time of battery-based power supply. Therefore, it can be integrated in a system chip to provide multiple supply voltage sources.
Keywords :
CMOS integrated circuits; DC-DC power convertors; leakage currents; power MOSFET; power supply circuits; CMOS process; DC-DC step-down converter; gate-oxide reliability; high-efficiency DC-DC buck converter; leakage current; size 0.18 mum; stacked power MOSFET; sub-3×VDD power supply; voltage 1 V; voltage level converter; Buck converters; Circuits; MOSFETs; Power generation; Power supplies; Pulse width modulation; Regulators; Signal generators; Switched-mode power supply; Voltage; DC-DC; gate-oxide reliability; step-down converter; sub-3×VDD;
Conference_Titel :
IC Design and Technology (ICICDT), 2010 IEEE International Conference on
Conference_Location :
Grenoble
Print_ISBN :
978-1-4244-5773-1
DOI :
10.1109/ICICDT.2010.5510269