• DocumentCode
    3030703
  • Title

    Random Test Run Length and Effectiveness

  • Author

    Andrews, James H. ; Groce, Alex ; Weston, Melissa ; Xu, Ru-Gang

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Western Ontario, London, ON
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    19
  • Lastpage
    28
  • Abstract
    A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear whether executing a small number of long runs or a large number of short runs maximizes utility. It is generally expected that longer runs are more likely to expose failures - which is certainly true with respect to runs shorter than the shortest failing trace. However, longer runs produce longer failing traces, requiring more effort from humans in debugging or more resources for automated minimization. In testing with feedback, increasing ranges for parameters may also cause the probability of failure to decrease in longer runs. We show that the choice of test length dramatically impacts the effectiveness of random testing, and that the patterns observed in simple models and predicted by analysis are useful in understanding effects observed in a large scale case study of a JPL flight software system.
  • Keywords
    program debugging; program testing; JPL flight software system; automated minimization; debugging; random test run length; Automatic testing; Computer science; Contracts; Debugging; Laboratories; Performance evaluation; Propulsion; Software testing; Space technology; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering, 2008. ASE 2008. 23rd IEEE/ACM International Conference on
  • Conference_Location
    L´Aquila
  • ISSN
    1938-4300
  • Print_ISBN
    978-1-4244-2187-9
  • Electronic_ISBN
    1938-4300
  • Type

    conf

  • DOI
    10.1109/ASE.2008.12
  • Filename
    4639305