DocumentCode :
3030703
Title :
Random Test Run Length and Effectiveness
Author :
Andrews, James H. ; Groce, Alex ; Weston, Melissa ; Xu, Ru-Gang
Author_Institution :
Dept. of Comput. Sci., Univ. of Western Ontario, London, ON
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
19
Lastpage :
28
Abstract :
A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear whether executing a small number of long runs or a large number of short runs maximizes utility. It is generally expected that longer runs are more likely to expose failures - which is certainly true with respect to runs shorter than the shortest failing trace. However, longer runs produce longer failing traces, requiring more effort from humans in debugging or more resources for automated minimization. In testing with feedback, increasing ranges for parameters may also cause the probability of failure to decrease in longer runs. We show that the choice of test length dramatically impacts the effectiveness of random testing, and that the patterns observed in simple models and predicted by analysis are useful in understanding effects observed in a large scale case study of a JPL flight software system.
Keywords :
program debugging; program testing; JPL flight software system; automated minimization; debugging; random test run length; Automatic testing; Computer science; Contracts; Debugging; Laboratories; Performance evaluation; Propulsion; Software testing; Space technology; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automated Software Engineering, 2008. ASE 2008. 23rd IEEE/ACM International Conference on
Conference_Location :
L´Aquila
ISSN :
1938-4300
Print_ISBN :
978-1-4244-2187-9
Electronic_ISBN :
1938-4300
Type :
conf
DOI :
10.1109/ASE.2008.12
Filename :
4639305
Link To Document :
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