DocumentCode :
3030798
Title :
Performance dependence on grading width of a-SiGe:H component solar cells
Author :
van Swaaij, R.A.C.M.M. ; Zeman, M. ; Arnoult, S. ; Metselaar, J.W.
Author_Institution :
Lab. of Electron. Components, Technol & Mater., Delft Univ. of Technol., Netherlands
fYear :
2000
fDate :
2000
Firstpage :
869
Lastpage :
872
Abstract :
For the bottom cell in a tandem structure, a-SiGe:H solar cells are often applied, because the red response of these cells is higher. In order to optimize the performance of these cells, the germanium concentration in the intrinsic layer is profiled. In this paper, the authors aim to understand, using computer simulations, the variation of external parameters of solar cells with the band-gap grading width near the interfaces. Experimental results show that grading is essential, but that the grading width near the p-i interface needs to be as small as possible, whereas that near the i-n interface needs to be as large as possible. Varying the grading width mainly affects the fill factor of the cells. Computer simulations indicate that the profile of the slope of the valence band tail in the graded regions is important, because it influences the density of state distribution in the cell
Keywords :
Ge-Si alloys; amorphous semiconductors; energy gap; hydrogen; p-n junctions; semiconductor device measurement; semiconductor device models; semiconductor device testing; semiconductor doping; solar cells; SiGe:H; a-SiGe:H component solar cells; band gap grading width; computer simulations; fill factor; germanium concentration profiling; i-n interface; intrinsic layer; p-i interface; performance dependence; red response; state distribution density; valence band tail; Amorphous silicon; Computer simulation; Electronic components; Germanium; Hydrogen; Laboratories; Photonic band gap; Photovoltaic cells; Probability distribution; Silicon alloys;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916021
Filename :
916021
Link To Document :
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