Title :
Optimization of emitter and interface of amorphous silicon/crystalline silicon heterojunction solar cells
Author :
Song, Y.J. ; Anderson, W.A.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Buffalo, NY, USA
Abstract :
The optimization of amorphous silicon/crystalline silicon (a-Si:H/c-Si) heterojunction solar cells was performed in terms of emitter material and heterointerface. Various conditions were explored and monitored by a residual gas analyzer. In addition, a thin microcrystalline (μc-Si) buffer layer was inserted into the heterojunction to improve the interface by bandgap grading. The conduction behavior is strongly influenced by the defect distribution and band offset at the hetero-interface. The recombination process dominates at low forward bias (V<0.3 V), whereas multi-step tunneling capture emission (MTCE) occurs in the higher bias region (0.3<V< 0.55 V) until the conduction becomes space charge limited (V>0.55 V). The reduced band offset at the interface increases current levels by the enhanced diffusion/emission process. The solar cell with a 700 Å a-Si:H top layer and a 200 Å, μc-Si buffer layer shows the maximum solar cell efficiency of around 10 %, without an antireflective coating by improving both the carrier transport and the red response of the cell
Keywords :
amorphous semiconductors; electron-hole recombination; elemental semiconductors; energy gap; hydrogen; optimisation; p-n heterojunctions; semiconductor thin films; silicon; solar cells; space charge; 200 A; 700 A; Si:H-Si; a-Si:H/c-Si heterojunction solar cells; band offset; bandgap grading; buffer layer; conduction behavior; defect distribution; emitter optimisation; interface optimisation; multi-step tunneling capture emission; recombination process; space charge limited conduction; Amorphous materials; Amorphous silicon; Buffer layers; Condition monitoring; Conducting materials; Crystalline materials; Crystallization; Heterojunctions; Photonic band gap; Photovoltaic cells;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916034