Title :
ESD protection design for differential low-noise amplifier with cross-coupled SCR
Author :
Chun-Yu Lin ; Ming-Dou Ker ; Yuan-Wen Hsiao
Author_Institution :
Inst. of Electron., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.
Keywords :
differential amplifiers; electrostatic discharge; low noise amplifiers; thyristors; LNA; cross-coupled SCR; cross-coupled silicon-controlled rectifier; differential low-noise amplifier; double-diode ESD protection scheme; CMOS technology; Circuits; Clamps; Electrostatic discharge; Low-noise amplifiers; Protection; Radio frequency; Robustness; Stress; Thyristors;
Conference_Titel :
IC Design and Technology (ICICDT), 2010 IEEE International Conference on
Conference_Location :
Grenoble
Print_ISBN :
978-1-4244-5773-1
DOI :
10.1109/ICICDT.2010.5510294