DocumentCode
3031094
Title
Numerical modeling and simulation of constant photocurrent method on a-Si p-i-n junction structure
Author
Lee, Chang Hyun ; Kim, Sang Soo ; Lim, Koeng Su
Author_Institution
Memory Div., Samsung Electron. Ltd., Kyungki, South Korea
fYear
2000
fDate
2000
Firstpage
936
Lastpage
939
Abstract
We present modeling and simulation of the constant photocurrent method (CPM) measurements on a single p-i-n junction a-Si:H solar cell. Two types of D-states with Gaussian distribution were introduced for describing subbandgap absorption, originating from the electron transition from the D-states to the conduction band. The subbandgap absorption spectra obtained by CPM measurements on p-i-n a-Si:H solar cells are given by solving Poission´s equation, continuity equation, and current equation simultaneously. The effect of D-state characteristics on the subbandgap absorption coefficient spectra of p-i-n a-Si:H solar cells is investigated systematically
Keywords
Gaussian distribution; Poisson equation; absorption coefficients; amorphous semiconductors; conduction bands; elemental semiconductors; hydrogen; p-n junctions; photoconductivity; silicon; solar cells; D-state characteristics; D-states; Gaussian distribution; Poission equation; Si:H; conduction band; constant photocurrent method; continuity equation; current equation; electron transition; numerical modeling; p-i-n junction a-Si:H solar cell; simulation; subbandgap absorption; subbandgap absorption coefficient spectra; subbandgap absorption spectra; Absorption; Current measurement; Electrons; Equations; Gaussian distribution; Numerical models; Numerical simulation; PIN photodiodes; Photoconductivity; Photovoltaic cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.916038
Filename
916038
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