• DocumentCode
    3031094
  • Title

    Numerical modeling and simulation of constant photocurrent method on a-Si p-i-n junction structure

  • Author

    Lee, Chang Hyun ; Kim, Sang Soo ; Lim, Koeng Su

  • Author_Institution
    Memory Div., Samsung Electron. Ltd., Kyungki, South Korea
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    936
  • Lastpage
    939
  • Abstract
    We present modeling and simulation of the constant photocurrent method (CPM) measurements on a single p-i-n junction a-Si:H solar cell. Two types of D-states with Gaussian distribution were introduced for describing subbandgap absorption, originating from the electron transition from the D-states to the conduction band. The subbandgap absorption spectra obtained by CPM measurements on p-i-n a-Si:H solar cells are given by solving Poission´s equation, continuity equation, and current equation simultaneously. The effect of D-state characteristics on the subbandgap absorption coefficient spectra of p-i-n a-Si:H solar cells is investigated systematically
  • Keywords
    Gaussian distribution; Poisson equation; absorption coefficients; amorphous semiconductors; conduction bands; elemental semiconductors; hydrogen; p-n junctions; photoconductivity; silicon; solar cells; D-state characteristics; D-states; Gaussian distribution; Poission equation; Si:H; conduction band; constant photocurrent method; continuity equation; current equation; electron transition; numerical modeling; p-i-n junction a-Si:H solar cell; simulation; subbandgap absorption; subbandgap absorption coefficient spectra; subbandgap absorption spectra; Absorption; Current measurement; Electrons; Equations; Gaussian distribution; Numerical models; Numerical simulation; PIN photodiodes; Photoconductivity; Photovoltaic cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916038
  • Filename
    916038