DocumentCode
3031177
Title
Triple-junction solar cell efficiencies above 32%: the promise and challenges of their application in high-conceniration-ratio PV systems
Author
Cotal, H.L. ; Lillington, D.R. ; Ermer, J.H. ; King, R.R. ; Karam, N.H. ; Kurtz, S.R. ; Friedman, D.J. ; Olson, J.M. ; Ward, J.S. ; Duda, A. ; Emery, K.A. ; Moriarty, T.
Author_Institution
Spectrolab Inc., Sylmar, CA, USA
fYear
2000
fDate
2000
Firstpage
955
Lastpage
960
Abstract
Results from Spectrolab-grown Ga0.5In0.5P/GaAs/Ge structures optimized for the AM1.5D spectrum are described along with progress toward developing next generation multijunction solar cells for high concentration ratios (X). The epitaxially-grown layers were processed into triple junction cells both at Spectrolab and NREL, and I-V tested vs. X. Cells were tested with efficiencies as high as 32.4% near 372 suns. The FF limited the performance with increasing X as a result of the increased role of the series resistance. The Voc vs. X showed its log-linear dependence on Isc over 1000 suns. Based on cell improvements for space applications, multijunction cells appear to be ideal candidates for high efficiency, cost effective, PV concentrator systems. Future development of new 1 eV materials for space cells, and further reduction in Ge wafer costs, promises to achieve cells with efficiencies >40% that cost $0.3/W or less at concentration levels between 300 to 500 suns
Keywords
III-V semiconductors; MOCVD coatings; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; p-n heterojunctions; semiconductor epitaxial layers; solar cells; solar energy concentrators; testing; vapour phase epitaxial growth; 32.4 percent; AM1.5D spectrum; Ga0.5In0.5P-GaAs-Ge; Ga0.5In0.5P/GaAs/Ge structures; Ge; Ge wafer costs reduction; I-V testing; NREL; PV concentrator systems; Spectrolab; epitaxially-grown layers; fill factor; high concentration ratios; high efficiency; high-concentration-ratio PV systems; log-linear dependence; multijunction solar cells; series resistance; solar cell testing; space applications; triple-junction solar cell; Ambient intelligence; Costs; Epitaxial layers; Photovoltaic cells; Production; Semiconductor device manufacture; Solar power generation; Space technology; Sun; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location
Anchorage, AK
ISSN
0160-8371
Print_ISBN
0-7803-5772-8
Type
conf
DOI
10.1109/PVSC.2000.916044
Filename
916044
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