DocumentCode :
3031275
Title :
Metamorphic GaInP/GaInAs/Ge solar cells
Author :
King, R.R. ; Haddad, M. ; Isshiki, T. ; Colter, P. ; Ermer, J. ; Yoon, H. ; Joslin, D.E. ; Karam, N.H.
Author_Institution :
Spectrolab Inc., Sylmar, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
982
Lastpage :
985
Abstract :
High-efficiency, metamorphic multijunction cells have been fabricated by growing GaInP/GaInAs subcells that are lattice-mismatched to an active Ge substrate, resulting in GaInP/GaInAs/Ge 3-junction (3J) cells. The efficiency dependence of this 3J cell on lattice-constant of the top two cells and on sublattice ordering in the GaInP top cell is presented. A variety of composition-graded buffers have been explored through X-ray diffraction reciprocal space mapping to measure strain in the cell layers, and transmission electron microscopy to minimize misfit and threading dislocations. Quantum efficiency is measured for metamorphic 1.3-eV Ga0.92In0.08As (8%-ln GaInAs) cells and 1.75-eV Ga0.43In0.57P cells grown on a Ge substrate, as well as for the 3J cell based on 4%-in GaInAs. Three-junction Ga0.43In0.57P/Ga0.92In 0.08As/Ge cells with 0.50% lattice-mismatch to the Ge substrate are measured to have AMO efficiency of 27.3% (0.1353 W/cm2, 28°C), similar to high-efficiency, conventional GaInP/GaAs/Ge 3-junction cells based on the GaAs lattice constant
Keywords :
X-ray diffraction; elemental semiconductors; gallium compounds; germanium; indium compounds; p-n heterojunctions; semiconductor device measurement; semiconductor device testing; semiconductor growth; solar cells; substrates; 1.3 eV; 1.75 eV; 27.3 percent; 28 C; GaInP-GaInAs-Ge; GaInP/GaInAs/Ge metamorphic solar cells; X-ray diffraction reciprocal space mapping; composition-graded buffers; lattice matching; lattice-constant; misfit dislocations minimisation; quantum efficiency measurement; substrate; threading dislocations minimisation; three-junction solar cells; transmission electron microscopy; Extraterrestrial measurements; Gallium arsenide; History; Indium; Lattices; Photonic band gap; Photovoltaic cells; Strain measurement; Transmission electron microscopy; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916050
Filename :
916050
Link To Document :
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