DocumentCode :
3031613
Title :
[Front cover]
fYear :
2011
fDate :
19-23 Sept. 2011
Abstract :
The following topics are dealt with: basic mechanisms of radiation effects; radiation hardness by design; radiation effects on electronic devices; radiation effects on photonic devices; simulation, prediction and modelling of SEE in electronic devices; laser induced single-event effects; radiation effects on systems; radiation environments: space, atmospheric and terrestrial; radiation hardness assurance; and testing facilities and dosimetry.
Keywords :
radiation hardening (electronics); semiconductor technology; SEE; dosimetry; electronic devices; laser induced single-event effects; photonic devices; radiation effects; radiation environments; radiation hardness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131288
Filename :
6131288
Link To Document :
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