DocumentCode
3031613
Title
[Front cover]
fYear
2011
fDate
19-23 Sept. 2011
Abstract
The following topics are dealt with: basic mechanisms of radiation effects; radiation hardness by design; radiation effects on electronic devices; radiation effects on photonic devices; simulation, prediction and modelling of SEE in electronic devices; laser induced single-event effects; radiation effects on systems; radiation environments: space, atmospheric and terrestrial; radiation hardness assurance; and testing facilities and dosimetry.
Keywords
radiation hardening (electronics); semiconductor technology; SEE; dosimetry; electronic devices; laser induced single-event effects; photonic devices; radiation effects; radiation environments; radiation hardness;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131288
Filename
6131288
Link To Document