• DocumentCode
    3031672
  • Title

    Interconnect analysis: from 3D structures to circuit models

  • Author

    Kamon, M. ; Marques, N. ; Massoud, Y. ; Silveira, L. ; White, J.

  • Author_Institution
    Res. Lab. of Electron., MIT, Cambridge, MA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    910
  • Lastpage
    914
  • Abstract
    In this survey paper we describe the combination of: discretized integral formulations, sparsification techniques, and Krylov-subspace based model-order reduction that has led to robust tools for automatic generation of macromodels that represent the distributed RLC effects in 3D interconnect. A few computational results are presented, mostly to point out the problems yet to be addressed
  • Keywords
    distributed parameter networks; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; sparse matrices; 3D structures; Krylov-subspace based model-order reduction; automatic generation; circuit models; computational results; discretized integral formulations; distributed RLC effects; interconnect analysis; macromodels; sparsification techniques; Conductors; Current density; Inductance; Integral equations; Integrated circuit interconnections; Laboratories; Paper technology; Permission; RLC circuits; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1999. Proceedings. 36th
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-58113-092-9
  • Type

    conf

  • DOI
    10.1109/DAC.1999.782221
  • Filename
    782221