DocumentCode :
3031694
Title :
GEANT4 analysis of n-Si nuclear reactions from different sources of neutrons and its implication on soft-error rate
Author :
Serre, S. ; Semikh, S. ; Uznanski, S. ; Autran, J.L. ; Munteanu, D. ; Gasiot, G. ; Roche, P.
Author_Institution :
Inst. of Mater., Microelectron. & Nanosci. of Provence, Aix-Marseille Univ., Marseille, France
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
11
Lastpage :
14
Abstract :
This work examines nuclear events resulting from the interaction of atmospheric neutrons at ground level and different synthetic (i.e. atmospheric-like) sources with a silicon layer. Using extensive GEANT4 simulations and in-depth data analysis, this study provides an accurate and fine comparison between several facilities, mono-energetic tests and natural environment in terms of nuclear processes, secondary ion production and fragment energy distribution. The different computed databases have been used in a second part of this work to estimate the soft-error rate of a widely characterized 65nm SRAM test circuit with the Tool suite for rAdiation Reliability Assessment (TIARA Monte-Carlo simulation code). A detailed analysis is conducted to clarify the mechanisms leading to both single and multiple cell upsets.
Keywords :
Monte Carlo methods; SRAM chips; neutron effects; radiation hardening (electronics); reliability; GEANT4 analysis; SRAM test; Si; TIARA Monte-Carlo simulation code; atmospheric neutrons; fragment energy distribution; ground level; in-depth data analysis; mono-energetic tests; n-Si nuclear reactions; secondary ion production; soft error rate; tool suite for radiation reliability assessment; Atmospheric modeling; Databases; Ions; Neutrons; Protons; Random access memory; Silicon; Cosmic-Ray induced neutrons; Geant4; SRAM; multiple cell upset; neutron beam testing; single-event upset; soft-error rate; terrestrial neutron spectrum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131292
Filename :
6131292
Link To Document :
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