Title :
QFDR-an integration of Quadded Logic for modern FPGAs to tolerate high radiation effect rates
Author :
Niknahad, Mahtab ; Sander, Oliver ; Becker, Juergen
Author_Institution :
Inst. for Inf. Process. Technol. (ITIV), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
For new device generations simply replicating complete systems in TMR manner may not be sufficient anymore. This especially applies to harsh environments, such as space applications, as higher failure rates may disturb a second instance before the faulty first one recovers. We focus on SEU mitigation challenges in nano scale reconfigurable architectures which can result in crucial situations. Our approach which is called Quadruple Force Decide Redundancy (QFDR), transforms the classical idea of Quadded Redundancy on Logic Gates to a technological view based on FPGA architecture primitives like LUTs.
Keywords :
fault tolerance; field programmable gate arrays; logic gates; radiation hardening (electronics); redundancy; FPGA; QFDR; SEU mitigation; failure rates; field programmable gate arrays; logic gates; quadded logic; quadded redundancy; quadruple force decide redundancy; radiation effect; single event upset; Fault tolerant systems; Field programmable gate arrays; Force; Redundancy; Table lookup; Tunneling magnetoresistance; FPGAs; Fault Tolerance Techniques; Quadded Logic; Radiation Effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131295