DocumentCode
3031743
Title
QFDR-an integration of Quadded Logic for modern FPGAs to tolerate high radiation effect rates
Author
Niknahad, Mahtab ; Sander, Oliver ; Becker, Juergen
Author_Institution
Inst. for Inf. Process. Technol. (ITIV), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
119
Lastpage
122
Abstract
For new device generations simply replicating complete systems in TMR manner may not be sufficient anymore. This especially applies to harsh environments, such as space applications, as higher failure rates may disturb a second instance before the faulty first one recovers. We focus on SEU mitigation challenges in nano scale reconfigurable architectures which can result in crucial situations. Our approach which is called Quadruple Force Decide Redundancy (QFDR), transforms the classical idea of Quadded Redundancy on Logic Gates to a technological view based on FPGA architecture primitives like LUTs.
Keywords
fault tolerance; field programmable gate arrays; logic gates; radiation hardening (electronics); redundancy; FPGA; QFDR; SEU mitigation; failure rates; field programmable gate arrays; logic gates; quadded logic; quadded redundancy; quadruple force decide redundancy; radiation effect; single event upset; Fault tolerant systems; Field programmable gate arrays; Force; Redundancy; Table lookup; Tunneling magnetoresistance; FPGAs; Fault Tolerance Techniques; Quadded Logic; Radiation Effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131295
Filename
6131295
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