• DocumentCode
    3031743
  • Title

    QFDR-an integration of Quadded Logic for modern FPGAs to tolerate high radiation effect rates

  • Author

    Niknahad, Mahtab ; Sander, Oliver ; Becker, Juergen

  • Author_Institution
    Inst. for Inf. Process. Technol. (ITIV), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    119
  • Lastpage
    122
  • Abstract
    For new device generations simply replicating complete systems in TMR manner may not be sufficient anymore. This especially applies to harsh environments, such as space applications, as higher failure rates may disturb a second instance before the faulty first one recovers. We focus on SEU mitigation challenges in nano scale reconfigurable architectures which can result in crucial situations. Our approach which is called Quadruple Force Decide Redundancy (QFDR), transforms the classical idea of Quadded Redundancy on Logic Gates to a technological view based on FPGA architecture primitives like LUTs.
  • Keywords
    fault tolerance; field programmable gate arrays; logic gates; radiation hardening (electronics); redundancy; FPGA; QFDR; SEU mitigation; failure rates; field programmable gate arrays; logic gates; quadded logic; quadded redundancy; quadruple force decide redundancy; radiation effect; single event upset; Fault tolerant systems; Field programmable gate arrays; Force; Redundancy; Table lookup; Tunneling magnetoresistance; FPGAs; Fault Tolerance Techniques; Quadded Logic; Radiation Effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131295
  • Filename
    6131295