DocumentCode :
3031758
Title :
Flight degradation data of GaAs-on-Si solar cells mounted on highly irradiated ETS-VI [satellite]
Author :
Imaizumi, Mitsuru ; Anzawa, Osamu ; Matsuda, Sumio ; Yamaguchi, Masafumi ; Ohara, Takahiko
Author_Institution :
Nat. Space Dev. Agency of Japan, Tokyo, Japan
fYear :
2000
fDate :
2000
Firstpage :
1075
Lastpage :
1078
Abstract :
Flight data of GaAs space solar cells fabricated on Si substrates (GaAs/Si) are analyzed by comparing with the data of GaAs cells on GaAs substrates (GaAs/GaAs). The initial performance of the GaAs/Si cells is comparable to the GaAs/GaAs cells. Both types of cells are mounted on the body of the ETS-VI satellite, which has been highly irradiated due to its anomalous orbit. The cells are estimated to be irradiated about ~1016 cm-2 level of equivalent 1 MeV electrons at the end of the flight data collection. The independence of the radiation hardness of GaAs/Si cells with respect to the thickness of the cover glass has been shown from the flight data. Also, better performance of GaAs/Si cells compared to GaAs/GaAs cells has observed in the case when a thin (50 μm) cover glass is used and the cells are highly irradiated. The characteristics of the GaAs/Si cells, in addition to taking advantage of its light-weight substrate, are considered to be effective advantage for space missions
Keywords :
III-V semiconductors; aerospace testing; elemental semiconductors; gallium arsenide; radiation effects; semiconductor device measurement; semiconductor device testing; silicon; solar cells; space vehicle power plants; substrates; 1 MeV; 50 mum; ETS-VI satellite; GaAs-Si; GaAs/Si space power solar cells; anomalous orbit; cover glass; flight degradation data; irradiation effects; photovoltaic performance; radiation hardness; space missions; substrates; Degradation; Electrons; Epitaxial growth; Epitaxial layers; Gallium arsenide; Glass; MOCVD; Photovoltaic cells; Satellites; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916073
Filename :
916073
Link To Document :
بازگشت