Title :
A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods
Author :
Sudani, Siva Kumar ; Li Xu ; Degang Chen
Abstract :
This paper observes that a number of new methods have emerged for efficient and effective testing of data converters, but there is no work comparing their strengths and weaknesses. The authors describes recent methods in detail, highlighting important aspects and contrasting their abilities to perform various test measurements.
Keywords :
analogue-digital conversion; integrated circuit testing; measurement systems; data converters; high-performance spectral test; state-of-the-art spectral test; test measurements; Data conversion; Discrete Fourier transforms; Frequency estimation; Harmonic analysis; Mixed analog digital integrated circuits; Noise measurement; Performance evaluation; Power system harmonics; Spectral analysis; System-on-chip;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2348315
