Title :
Improving SEU fault tolerance capabilities of a self-converging algorithm
Author :
Velazco, Raoul ; Mansour, Wassim ; Pancher, Fabrice ; Marques-Costa, Greicy ; Sohier, Devan ; Bui, Alain
Author_Institution :
TIMA, Grenoble, France
Abstract :
The SEU fault-tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
Keywords :
fault tolerance; integrated circuit reliability; integrated circuit testing; SEU fault tolerance; benchmark self-converging algorithm; devoted test platform; fault injection; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Registers; Sensitivity; Single event upset; SEU; Self-stabilization; TMR; fault injection; fault tolerance;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131299
