• DocumentCode
    3031812
  • Title

    Improving SEU fault tolerance capabilities of a self-converging algorithm

  • Author

    Velazco, Raoul ; Mansour, Wassim ; Pancher, Fabrice ; Marques-Costa, Greicy ; Sohier, Devan ; Bui, Alain

  • Author_Institution
    TIMA, Grenoble, France
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    138
  • Lastpage
    143
  • Abstract
    The SEU fault-tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
  • Keywords
    fault tolerance; integrated circuit reliability; integrated circuit testing; SEU fault tolerance; benchmark self-converging algorithm; devoted test platform; fault injection; Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Registers; Sensitivity; Single event upset; SEU; Self-stabilization; TMR; fault injection; fault tolerance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131299
  • Filename
    6131299
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3031812