Title :
A study in coverage-driven test generation
Author :
Benjamin, Mike ; Geist, Daniel ; Hartman, Alan ; Wolfsthal, Yaron ; Mas, Gerard ; Smeets, Ralph
Author_Institution :
STMicroelectron., Bristol, UK
Abstract :
One possible solution to the verification crisis is to bridge the gap between formal verification and simulation by using hybrid techniques. This paper presents a study of such a functional verification methodology that uses coverage of formal models to specify tests. This was applied to a modern superscalar microprocessor and the resulting tests were compared to tests generated using existing methods. The results showed some 50% improvement in transition coverage with less than a third the number of test instructions, demonstrating that hybrid techniques can significantly improve functional verification
Keywords :
automatic test pattern generation; automatic test software; digital simulation; formal verification; logic simulation; logic testing; GOTCHA tool; coverage-driven test generation; formal models; formal verification; functional verification methodology; hybrid techniques; simulation; superscalar microprocessor; test specification; transition coverage; Bridges; Chemical technology; Electronic design automation and methodology; Explosions; Formal verification; Hybrid power systems; Microprocessors; Permission; State-space methods; Testing;
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
DOI :
10.1109/DAC.1999.782237
