DocumentCode :
303186
Title :
Reduction of voltage stress in charge pump electronic ballast
Author :
Chen, Wei ; Lee, Fred C. ; Yamauchi, Tokushi
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
1
fYear :
1996
fDate :
23-27 Jun 1996
Firstpage :
887
Abstract :
The charge pump electronic ballast circuit, which employs a charging capacitor and a high frequency AC source to implement the power factor correction (PFC), has become an attractive topology for ballasting the fluorescent lamps because it eliminates the use of a bulky boost inductor. But this circuit has the problem of high voltage stress at light load operations especially during the preheat and startup operations of the lamps. Based on the analysis of the operation principle, the following solution was proposed. With the introduction of a second resonance stage, the voltage stress in this ballast was reduced by half. The experimental results are provided for verification
Keywords :
capacitors; fluorescent lamps; lamp accessories; power convertors; power factor correction; charge pump electronic ballast; fluorescent lamps; high frequency AC source; light load; power factor correction; preheat operation; resonance stage; startup operation; voltage stress reduction; Capacitors; Charge pumps; Circuit topology; Electronic ballasts; Fluorescent lamps; Frequency; Inductors; Power factor correction; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1996. PESC '96 Record., 27th Annual IEEE
Conference_Location :
Baveno
ISSN :
0275-9306
Print_ISBN :
0-7803-3500-7
Type :
conf
DOI :
10.1109/PESC.1996.548686
Filename :
548686
Link To Document :
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