• DocumentCode
    3031915
  • Title

    MBU characterization of NAND-Flash memories under heavy-ion irradiation

  • Author

    Grü, K. ; Walter, D. ; Herrmann, M. ; Gliem, F. ; Kettunen, H. ; Ferlet-Cavrois, V.

  • Author_Institution
    IDA, Tech. Univ. of Braunschweig, Braunschweig, Germany
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    207
  • Lastpage
    212
  • Abstract
    The angular dependence of the MBU-Cross-Section of two 8-Gbit-SLC-NAND-Flash and the orientation of the MBU-pattern has been measured.
  • Keywords
    NAND circuits; flash memories; MBU cross-section characterization; MBU-pattern orientation; NAND-Flash memories; angular dependence; heavy-ion irradiation; multibyte upsets; storage capacity 8 Gbit; Argon; Azimuth; Educational institutions; Europe; Measurement uncertainty; Performance evaluation; Radiation effects; Angular Dependence; MBU; NAND-Flash; SEE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131305
  • Filename
    6131305
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3031915