Title :
SET characterization & mitigation in 65-nm test structures
Author :
Rezgui, Sana ; Won, Raymond ; Tien, Jonathan ; George, Jeffrey
Author_Institution :
Actel Corp., Mountain View, CA, USA
Abstract :
SET propagation and mitigation in 65-nm test structures are investigated. Radiation tests show a clear distortion of the SET pulse-widths related to the structures´ design and layout and the efficacy of the employed mitigation techniques.
Keywords :
field programmable gate arrays; radiation hardening (electronics); SET mitigation; SET propagation; SET pulse-width; field programmable gate arrays; radiation tests; single event transient; size 65 nm; Delay; Field programmable gate arrays; Inverters; Latches; Logic gates; Routing; Table lookup; Fault Injection; Propagation and Mitigation; SET Characterization; radiation tests; reprogrammable and non-volatile Flash-based FPGAs;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131306
