DocumentCode :
3031959
Title :
Characterization of bulk damage in CMOS MAPS with deep N-well collecting electrode
Author :
Zucca, Stefano ; Ratti, Lodovico ; Traversi, Gianluca ; Bettarini, Stefano ; Morsani, Fabio ; Rizzo, Giuliana ; Bosisio, Luciano ; Rashevskaya, Irina ; Cindro, Vladimir
Author_Institution :
Dipt. di Elettron., Univ. degli Studi di Pavia, Pavia, Italy
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
297
Lastpage :
304
Abstract :
Monolithic active pixel sensors in CMOS technology, featuring a deep N-well as the collecting electrode (so called DNW MAPS), have been exposed to neutrons from a nuclear reactor, up to a total 1 MeV neutron equivalent fluence of about 3.7×1013 cm-2. The irradiation campaign was aimed at studying the effects of radiation induced displacement damage on the charge collection properties of the device, which was conceived for applications to charged particle tracking in high energy physics experiments. A number of different techniques, including electrical characterization of the front-end electronics and of DNW diodes, laser stimulation of the sensors and tests with 55Fe and 90Sr radioactive sources, has been employed for evaluating the device operation before and after irradiation. This paper discusses the measurement results and their relation with the bulk damage mechanisms underlying performance degradation in DNW MAPS.
Keywords :
CMOS image sensors; electrodes; radiation effects; CMOS MAPS technology; CMOS monolithic active pixel sensor technology; DNW diode; bulk damage characterization; charge collection property; charged particle tracking; deep N-well collecting electrode; front-end electronic electrical characterization; high energy physics experiment; neutron equivalent; neutron exposure; nuclear reactor; radiation effect; radiation induced displacement damage; radioactive source; sensor laser stimulation; Detectors; Junctions; Leakage current; Neutrons; Radiation effects; Sensitivity; CMOS MAPS; Deep N-well sensor; bulk damage; charge collection efficiency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131308
Filename :
6131308
Link To Document :
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