• DocumentCode
    3032146
  • Title

    Compendium of TID and SEE test results for various candidate spacecraft electronics

  • Author

    Malou, Florence ; Dangla, David ; Rousset, Alexandre ; Guerre, François-Xavier

  • Author_Institution
    Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    863
  • Lastpage
    870
  • Abstract
    We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event effects. Most of the tested devices are commercial integrated circuits, including Memories, Analog-to-Digital Converters and others.
  • Keywords
    integrated circuit testing; space vehicle electronics; SEE test results; TID; analog-to-digital converters; commercial integrated circuits; heavy ion induced single event effects; spacecraft electronics; Ions; Performance evaluation; Power supplies; Silicon; Temperature measurement; Testing; Xenon; Component; Radiation; Spacecraft; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131318
  • Filename
    6131318
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3032146