Title :
Compendium of TID and SEE test results for various candidate spacecraft electronics
Author :
Malou, Florence ; Dangla, David ; Rousset, Alexandre ; Guerre, François-Xavier
Author_Institution :
Centre Nat. d´´Etudes Spatiales (CNES), Toulouse, France
Abstract :
We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event effects. Most of the tested devices are commercial integrated circuits, including Memories, Analog-to-Digital Converters and others.
Keywords :
integrated circuit testing; space vehicle electronics; SEE test results; TID; analog-to-digital converters; commercial integrated circuits; heavy ion induced single event effects; spacecraft electronics; Ions; Performance evaluation; Power supplies; Silicon; Temperature measurement; Testing; Xenon; Component; Radiation; Spacecraft; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131318
