Title :
Laser tests on a power operational amplifier
Author :
Palomar, C. ; López-Calle, I. ; Franco, F.J. ; Izquierdo, J.G. ; Agapito, J.A.
Author_Institution :
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid (UCM), Madrid, Spain
Abstract :
Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candidate to develop power systems to be used in radiation environments.
Keywords :
integrated circuit testing; laser beam applications; operational amplifiers; power amplifiers; radiation effects; laser test; power operational amplifier; power system; radiation environments; single event transients; Junctions; Lasers; Power supplies; Resistors; Transient analysis; Transistors; Laser irradiation; OPA541; operational amplifiers; power devices; single event transients; single-photon absorption;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131322
