Title :
Proceedings. 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems (Cat. No.91TH0395-4)
Abstract :
The following topics are dealt with: computer architecture; fault/yield models; fault tolerance; testing; and reconfiguration
Keywords :
VLSI; computer architecture; fault tolerant computing; integrated circuit testing; VLSI; computer architecture; conferences; fault models; fault tolerance; reconfiguration; testing; yield models;
Conference_Titel :
Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on
Print_ISBN :
0-8186-2457-4
DOI :
10.1109/DFTVS.1991.199933
