DocumentCode :
3032349
Title :
Single Event Effects of commercial and Hardened by design SRAM
Author :
Milliken, Peter ; Dumitru, Radu ; Hafer, Craig ; Wu, Tzu-Wen ; Rominger, Rob ; Bruno, Kevin ; Farris, Teresa
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
913
Lastpage :
917
Abstract :
Power and speed constrains in the field of Radiation Hardened integrated circuits has become increasingly critical in today´s designs. In recent years, an increased interest in using high density and enhanced electrical performance radiation-hardened integrated circuits (ICs) is driving the industry to utilize commercial foundries as a way of achieving an optimum cost-performance ratio. Radiation hardened-by-design approaches offer the benefits of tapping into the big pool of commercial foundries while maintaining the radiation hardness requirements through innovative design solutions.
Keywords :
SRAM chips; integrated circuit design; radiation hardening (electronics); SRAM; commercial foundries; enhanced electrical performance radiation-hardened integrated circuits; optimum cost-performance ratio; power constrains; radiation hardened-by-design approaches; single event effects; speed constrains; Clocks; Flip-flops; Libraries; Random access memory; Single event upset; Springs; Transistors; ASIC Library; Commercial and Radiation Hardened SRAM; RadHard-by-Design (RHBD); Single Event Latch-up; Single Event Upset (SEU); Total Ionizing Dose (TID);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131328
Filename :
6131328
Link To Document :
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