• DocumentCode
    3032349
  • Title

    Single Event Effects of commercial and Hardened by design SRAM

  • Author

    Milliken, Peter ; Dumitru, Radu ; Hafer, Craig ; Wu, Tzu-Wen ; Rominger, Rob ; Bruno, Kevin ; Farris, Teresa

  • Author_Institution
    Aeroflex Colorado Springs, Colorado Springs, CO, USA
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    913
  • Lastpage
    917
  • Abstract
    Power and speed constrains in the field of Radiation Hardened integrated circuits has become increasingly critical in today´s designs. In recent years, an increased interest in using high density and enhanced electrical performance radiation-hardened integrated circuits (ICs) is driving the industry to utilize commercial foundries as a way of achieving an optimum cost-performance ratio. Radiation hardened-by-design approaches offer the benefits of tapping into the big pool of commercial foundries while maintaining the radiation hardness requirements through innovative design solutions.
  • Keywords
    SRAM chips; integrated circuit design; radiation hardening (electronics); SRAM; commercial foundries; enhanced electrical performance radiation-hardened integrated circuits; optimum cost-performance ratio; power constrains; radiation hardened-by-design approaches; single event effects; speed constrains; Clocks; Flip-flops; Libraries; Random access memory; Single event upset; Springs; Transistors; ASIC Library; Commercial and Radiation Hardened SRAM; RadHard-by-Design (RHBD); Single Event Latch-up; Single Event Upset (SEU); Total Ionizing Dose (TID);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131328
  • Filename
    6131328