DocumentCode :
3032350
Title :
Modeling of electron diffusion length in GaInAsN solar cells
Author :
Kurtz, Sarah ; Geisz, J.F. ; Friedman, D.J. ; Olson, J.M. ; Duda, A. ; Karam, N.H. ; King, R.R. ; Ermer, J.H. ; Joslin, And D E
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2000
fDate :
2000
Firstpage :
1210
Lastpage :
1213
Abstract :
This paper seeks to quantify the electron diffusion length in p-type GaInAsN and to understand the performance of GaInAsN cells. The usual modeling is complicated because the electron diffusion length is quite short (often <0.1 μm) and is usually less than the hole diffusion length. The properties (e.g. absorption and transport) of GaInAsN are both variable and poorly studied, and, because the band gap of GaInAsN is less than the band gap of the substrate, light that is transmitted through the GaInAsN layer may be reflected from the back metallization and make a second pass through the GaInAsN. Layers that are expected to be p-type can sometimes change to n-type, changing the location of the junction and complicating the modeling, but improving the performance of the cell. Internal quantum efficiencies as high as 80% near the GaAs band edge are reported
Keywords :
III-V semiconductors; diffusion; energy gap; gallium arsenide; indium compounds; semiconductor device models; solar cells; GaAs band edge; GaInAsN; GaInAsN solar cells; absorption properties; back metallization; band gap; electron diffusion length modelling; internal quantum efficiency; photovoltaic performance; transport properties; Absorption; Electrons; Gallium arsenide; Heterojunctions; Photonic band gap; Photovoltaic cells; Reflection; Reflectivity; Semiconductor device modeling; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
ISSN :
0160-8371
Print_ISBN :
0-7803-5772-8
Type :
conf
DOI :
10.1109/PVSC.2000.916106
Filename :
916106
Link To Document :
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