Radiation performance of a monolithic synchronous DC-DC point of load regulator for harsh environments

Author

Parkhurst, Charles ; Torres, Hector ; Hamlyn, Mark ; Acosta, Julio ; Salzman, James F.

Author_Institution

IEEE Texas Instrum. Inc., Dallas, TX, USA

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

918

Lastpage

921

Abstract

This work reviews the design and performance of a fully monolithic 6A synchronous buck converter for harsh environments. Radiation test results of total ionizing dose and single event effects are reported for the TPS50601-SP. Extended temperature performance is also discussed. The TPS50601-SP is fabricated in Texas Instruments 7^th generation BiCMOS process technology developed for power system products.

Keywords

BiCMOS integrated circuits; DC-DC power convertors; radiation hardening (electronics); TPS50601-SP fabrication; Texas Instruments 7^th generation BiCMOS process technology; current 6 A; fully monolithic synchronous buck converter; monolithic synchronous DC-DC point of load regulator; power system product; radiation performance testing; single event effect; total ionizing dose effect; Integrated circuit modeling; Layout; Logic gates; Performance evaluation; Power MOSFET; Transistors; DC-DC power converters; heavy ions; modeling; radiation hardening; single event transients;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131329

Filename

6131329