Title :
Radiation performance of a monolithic synchronous DC-DC point of load regulator for harsh environments
Author :
Parkhurst, Charles ; Torres, Hector ; Hamlyn, Mark ; Acosta, Julio ; Salzman, James F.
Author_Institution :
IEEE Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This work reviews the design and performance of a fully monolithic 6A synchronous buck converter for harsh environments. Radiation test results of total ionizing dose and single event effects are reported for the TPS50601-SP. Extended temperature performance is also discussed. The TPS50601-SP is fabricated in Texas Instruments 7th generation BiCMOS process technology developed for power system products.
Keywords :
BiCMOS integrated circuits; DC-DC power convertors; radiation hardening (electronics); TPS50601-SP fabrication; Texas Instruments 7th generation BiCMOS process technology; current 6 A; fully monolithic synchronous buck converter; monolithic synchronous DC-DC point of load regulator; power system product; radiation performance testing; single event effect; total ionizing dose effect; Integrated circuit modeling; Layout; Logic gates; Performance evaluation; Power MOSFET; Transistors; DC-DC power converters; heavy ions; modeling; radiation hardening; single event transients;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131329
