Title :
Current-mode techniques for analog VLSI: technology and defect tolerance issues
Author_Institution :
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD
Abstract :
Future large scale analog computational systems will have to cope with manufacturing defects and mismatch in individual components. The author argues that current-mode design techniques, and in particular minimal designs at the transistor level are consistent with future manufacturing requirements for wafer scale analog systems
Keywords :
VLSI; analogue computer circuits; fault tolerant computing; linear integrated circuits; WSI; analog VLSI; current-mode design techniques; defect tolerance issues; large scale analog computational systems; manufacturing defects; manufacturing requirements; minimal designs; mismatch in individual components; transistor level; wafer scale analog systems; Analog computers; Biology computing; Circuit faults; Computer aided manufacturing; Geometry; Information processing; Large-scale systems; Space technology; Very large scale integration; Voltage;
Conference_Titel :
Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on
Conference_Location :
Hidden Valley, PA
Print_ISBN :
0-8186-2457-4
DOI :
10.1109/DFTVS.1991.199942
