Title :
Radiation characterization of a dual core LEON3-FT processor
Author :
Sturesson, F. ; Gaisler, J. ; Ginosar, R. ; Liran, T.
Author_Institution :
AeroflexGaisler AB, Gothenburg, Sweden
Abstract :
GR712RC is a dual core 32-bit fault-tolerant SPARC™V8/LEON3-FT processor that has been developed and manufactured by Ramon Chip Ltd and AeroflexGaisler AB and characterized for radiation effects. It is designed with AeroflexGaisler´s intellectual property and implemented with Ramon Chip´s RadSafe™ radiation-hard-by-design library in a commercial 0.18μm shallow trench isolation CMOS process. Radiation test results for total ionizing dose, single event latch-up and single event upset data with correction/data-restore methodologies are reported, demonstrating its suitability for operating in a space environment.
Keywords :
CMOS digital integrated circuits; fault tolerance; flip-flops; integrated circuit design; microprocessor chips; radiation hardening (electronics); AeroflexGaisler AB; AeroflexGaisler´s intellectual property; GR712RC dual core fault-tolerant SPARCV8-LEON3-FT processor; Ramon Chip Ltd manufacturing; Ramon Chip´s RadSafe radiation-hard-by-design library; correction-data-restore methodology; radiation effect characterization; radiation testing; shallow trench isolation CMOS process; single event latch-up; single event upset data; size 0.18 mum; total ionizing dose; word length 32 bit; Clocks; Radiation effects; Random access memory; Registers; Single event upset; Software; Testing; Error correction; Processor; Single Event Upsets; Total Ionizing Dose;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131334
