Title :
The influence of the electrical conditions on total dose behavior of the analog switches
Author :
Boychenko, Dmitry V. ; Kessarinskiy, Leonid N. ; Pechenkina, Darya V.
Author_Institution :
Specialized Electron. Syst. (SPELS), Moscow, Russia
Abstract :
The influence of the electrical conditions on analog switches total dose behavior is investigated. The major difference in analog switches radiation hardness due to irradiation and measurement conditions is confirmed.
Keywords :
analogue circuits; radiation hardening (electronics); switches; analog switches; electrical conditions; irradiation condition; measurement condition; radiation hardness; total-dose behavior; CMOS integrated circuits; Current measurement; Degradation; Leakage current; Multiplexing; Radiation effects; Switches; Dose rate; Integrated circuits; Radiation hardness; Total dose;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131340
