• DocumentCode
    3032758
  • Title

    Fabrication of Si trench solar cells with improved radiation hardness for space applications

  • Author

    Presting, H. ; Konle, J. ; Behammer, D. ; Gruhle, A. ; Uebele, P. ; Strobl, G.

  • Author_Institution
    DaimlerChrysler Res. Center, Ulm, Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1293
  • Lastpage
    1296
  • Abstract
    Mono-crystalline silicon (Si) space solar cells were fabricated with deep holes (0.5-0.7 × substrate thickness) etched into a standard p-doped Si substrate by a high etch rate plasma apparatus. After the etch an n+ emitter diffusion is done inside and outside of the holes followed by cleaning and thermal passivation. The cells have been electron irradiated by a 1 MeV radiation with different doses up to 3 1015 cm-2 and the cell efficiency η, the short circuit current Isc and the open circuit voltage Voc have been measured before and after radiation and compared to a Si reference cell. The fabrication process of the trench cell has been kept fully compatible with standard Si cell processing
  • Keywords
    electron beam effects; elemental semiconductors; isolation technology; passivation; radiation hardening (electronics); short-circuit currents; silicon; solar cells; space vehicle power plants; 1 MeV; Si; Si reference cell; Si trench solar cells fabrication; cleaning; deep holes; electron irradiation; high etch rate plasma apparatus; improved radiation hardness; mono-crystalline silicon space solar cells; n+ emitter diffusion; open circuit voltage; p-doped Si substrate; short circuit current; space applications; substrate thickness; thermal passivation; Cleaning; Electrons; Etching; Fabrication; Passivation; Photovoltaic cells; Plasma applications; Short circuit currents; Silicon; Time of arrival estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
  • Conference_Location
    Anchorage, AK
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-5772-8
  • Type

    conf

  • DOI
    10.1109/PVSC.2000.916127
  • Filename
    916127