Title :
Comparison of single event transients generated at four pulsed-laser test facilities - NRL, IMS, EADS, JPL
Author :
Buchner, S. ; Warner, J. ; McMorrow, D. ; Miller, F. ; Morand, S. ; Pouget, V. ; Larue, C. ; Adell, P. ; Allen, G.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Single event transients generated in a large-area photodiode were compared using a variety of different pulsed laser systems. Differences in transient amplitudes and charge collection are attributed to the different laser characteristics.
Keywords :
photodiodes; radiation hardening (electronics); EADS; IMS; JPL; NRL; charge collection; large-area photodiode; pulsed-laser test facilities; single event transients; transient amplitudes; Electric fields; Laser beams; Pulsed laser deposition; Semiconductor lasers; Shape; Transient analysis;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131349
