DocumentCode
3032845
Title
A Portable Low-Cost SEU Evaluation Board for SRAMs
Author
Franco, Francisco J. ; Velazco, Raoul
Author_Institution
TIMA Lab. (QLF Team), Grenoble
fYear
2007
fDate
Jan. 31 2007-Feb. 2 2007
Firstpage
165
Lastpage
168
Abstract
This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.
Keywords
SRAM chips; logic testing; radiation effects; sensitivity; SEU evaluation board; SRAM; cosmic ray interaction; field test system; natural radiation effects; sensitivity; single event upset; Atmosphere; Cosmic rays; Field programmable gate arrays; Laboratories; Microprocessors; Neutrons; Performance evaluation; Random access memory; Single event upset; System testing; Cosmic rays; SRAMs; neutrons; single event effects; soft error rate;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices, 2007 Spanish Conference on
Conference_Location
Madrid
Print_ISBN
1-4244-0868-7
Type
conf
DOI
10.1109/SCED.2007.384018
Filename
4271195
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