Title :
Improved fine-scale laser mapping of component SEE sensitivity
Author :
Chugg, Andrew M. ; Ward, Jonathan ; McIntosh, James ; Flynn, Nathan ; Duncan, Peter H. ; Barber, Thomas S. ; Poivey, Christian
Author_Institution :
Radiat. Effects Group, MBDA UK Ltd., Bristol, UK
Abstract :
We have devised, implemented and demonstrated new scanning technology, smoother scanning algorithms and a capability to read selectable sub-sections of memory devices in order to accelerate laser SEE testing and address descrambling for interpreting MCU´s and burst errors.
Keywords :
microcontrollers; radiation hardening (electronics); semiconductor device testing; MCU; component SEE sensitivity; improved fine-scale laser mapping; laser SEE testing; memory devices; smoother scanning algorithms; Microchip lasers; Semiconductor laser arrays; Sensitivity; Single event upset; Spirals; Trajectory; Piezoelectric transducers; Pulsed lasers; Semiconductor device radiation effects;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131351
