DocumentCode
3032872
Title
Improved fine-scale laser mapping of component SEE sensitivity
Author
Chugg, Andrew M. ; Ward, Jonathan ; McIntosh, James ; Flynn, Nathan ; Duncan, Peter H. ; Barber, Thomas S. ; Poivey, Christian
Author_Institution
Radiat. Effects Group, MBDA UK Ltd., Bristol, UK
fYear
2011
fDate
19-23 Sept. 2011
Firstpage
442
Lastpage
448
Abstract
We have devised, implemented and demonstrated new scanning technology, smoother scanning algorithms and a capability to read selectable sub-sections of memory devices in order to accelerate laser SEE testing and address descrambling for interpreting MCU´s and burst errors.
Keywords
microcontrollers; radiation hardening (electronics); semiconductor device testing; MCU; component SEE sensitivity; improved fine-scale laser mapping; laser SEE testing; memory devices; smoother scanning algorithms; Microchip lasers; Semiconductor laser arrays; Sensitivity; Single event upset; Spirals; Trajectory; Piezoelectric transducers; Pulsed lasers; Semiconductor device radiation effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location
Sevilla
ISSN
0379-6566
Print_ISBN
978-1-4577-0585-4
Type
conf
DOI
10.1109/RADECS.2011.6131351
Filename
6131351
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