Title :
Fast search algorithms for reconfiguration problems
Author :
Libeskind-Hadas, Ran ; Liu, C.L.
Author_Institution :
Dept. of Comput. Sci., Illinois Univ., Urbana-Champaign, IL, USA
Abstract :
A number of reconfiguration strategies have been proposed for increasing the yield of VLSI chips. In most cases the associated reconfiguration problems are NP-complete. Therefore, exhaustive search algorithms are generally used in order to find a solution when one exists. In this paper we present the notion of admissible sets and show how such sets can be used to significantly reduce the running time of many exhaustive search algorithms for reconfiguration problems. As an example, the authors find a class of admissible sets called excess-k critical sets that can be used in the design of fast search algorithms for the problem of reconfiguring redundant random access memories (RRAMs). They also consider applications to the problems of reconfiguring RRAMs with shared spares and reconfiguring redundant programmable logic arrays (RPLAs). Experimental results indicate that this approach is very powerful
Keywords :
VLSI; integrated memory circuits; logic CAD; logic arrays; random-access storage; redundancy; NP-complete problem; PLAs; RAMs; VLSI chip yield; admissible sets; excess-k critical sets; fast search algorithms; reconfiguration problems; reconfiguration strategies; redundant programmable logic arrays; redundant random access memories; shared spares; Algorithm design and analysis; Circuit faults; Computer science; Fabrication; Fault diagnosis; Programmable logic arrays; Radio access networks; Switching circuits; Turning; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance on VLSI Systems, 1991. Proceedings., 1991 International Workshop on
Conference_Location :
Hidden Valley, PA
Print_ISBN :
0-8186-2457-4
DOI :
10.1109/DFTVS.1991.199969