Title :
Evaluating the use of a platform for combined tests of total ionizing dose radiation and Electromagnetic immunity
Author :
Benfica, J. ; Poehls, L. M Bolzani ; Vargas, F. ; Lipovetzky, J. ; Lutenberg, A. ; García, S.E. ; Gatti, E. ; Hernandez, F. ; Calazans, N.L.V.
Author_Institution :
Catholic Univ. of Rio Grande do Sul (PUCRS), Porto Alegre, Brazil
Abstract :
Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, no effort has been made to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.
Keywords :
electromagnetic interference; embedded systems; field programmable gate arrays; integrated circuit reliability; logic testing; radiation hardening (electronics); EM immunity; EM interference; EMI; FPGA; TID radiation; combined tests; delay probability; electromagnetic immunity; embedded system reliabilty; embedded systems; fault occurrence probability; total-ionizing dose radiation; Delay; Electromagnetic interference; Field programmable gate arrays; IEC standards; Noise; Power supplies; Voltage fluctuations; Electromagnetic Immunity; Embedded Systems; Total Ionizing Dose Radiation;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131354
