DocumentCode :
3032950
Title :
A 90-nm radiation hardened clock spine
Author :
Chellappa, Srivatsan ; Clark, Lawrence T. ; Holbert, Keith E.
Author_Institution :
Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
479
Lastpage :
484
Abstract :
A RHBD clock distribution network is described that reliably synchronizes the flow of signals through an integrated circuit in the presence of SETs. The clock spine design controls both redundant and non-redundant hardened circuits. The design uses techniques to reduce the jitter due to SETs, as well as error detection at every clock edge, since errors may be in the clock gating enables rather than the clocks themselves. The clock spine has been fabricated and tested on both standard and a low power 90-nm test chips, and proven hard as demonstrated by both heavy ion and proton broad beam testing.
Keywords :
clock distribution networks; clocks; integrated circuit design; integrated circuit reliability; jitter; low-power electronics; radiation hardening (electronics); RHBD clock distribution network; SET; clock gating; error detection; heavy ion testing; integrated circuit; low power test chip; nonredundant hardened circuit; proton broad beam testing; radiation hardened clock spine design; redundant hardened circuit; size 90 nm; Capacitance; Clocks; Jitter; Logic gates; Phase locked loops; Radiation hardening; Synchronization; Radiation hardening by design; clock generation; single event transients; single event upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131355
Filename :
6131355
Link To Document :
بازگشت