Single-event vulnerability of mixed-signal circuit interfaces

Author

Armstrong, S.E. ; Blaine, R.W. ; Holman, W.T. ; Massengill, L.W.

Author_Institution

NAVSEA Crane, IN, USA

fYear

2011

fDate

19-23 Sept. 2011

Firstpage

485

Lastpage

488

Abstract

The design of high-speed communications devices requires design decisions as to the type of signal best suited for data propagation. Current-mode logic is the industry standard for high-speed CMOS circuit design due to the fast switching speed. However, the outputs do not go rail-to-rail and therefore require a conversion back to full-swing CMOS logic. This interface between current-mode and CMOS logic is found to be vulnerable to single-event effects. A radiation-hardened-by-design solution is proposed for such interfaces.

Keywords

CMOS logic circuits; logic design; mixed analogue-digital integrated circuits; radiation hardening (electronics); current-mode logic; data propagation; full-swing CMOS logic; high-speed CMOS circuit design; high-speed communications device design; mixed-signal circuit interfaces; radiation-hardened-by-design solution; single-event effects; single-event vulnerability; CMOS integrated circuits; Integrated circuit modeling; Layout; Radiation effects; Radiation hardening; Semiconductor device modeling; Transient analysis; High-speed integrated circuit design; Radiation Hardening by Design; Semiconductor device radiation effects; Single event effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on

Conference_Location

Sevilla

ISSN

0379-6566

Print_ISBN

978-1-4577-0585-4

Type

conf

DOI

10.1109/RADECS.2011.6131356

Filename

6131356