DocumentCode :
3033080
Title :
How to sample results of concurrent error detection schemes in transient fault scenarios?
Author :
Bastos, Rodrigo P. ; Natale, Giorgio Di ; Flottes, Marie-Lise ; Rouzeyre, Bruno
Author_Institution :
LIRMM, Univ. Montpellier II, Montpellier, France
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
635
Lastpage :
642
Abstract :
This work analyses and classifies strategies for sampling results of concurrent error detection (CED) schemes in transient fault scenarios. It shows that dealing with results - indicating the occurrence of transient faults in circuits - can require additional mechanisms to make the error indication useful for system´s recovery procedures. The paper highlights that not all error indications are noticed by certain strategies of varied costs, and therefore their efficiencies in sampling results as well as the performance, power, and area overheads added to the CED schemes must be considered. The work then finishes presenting a qualitative comparison between existing strategies in function of design goals.
Keywords :
combinational circuits; fault diagnosis; flip-flops; integrated circuit reliability; radiation hardening (electronics); transient analysis; CED schemes; area overhead; circuits; concurrent error detection schemes; performance overhead; power overhead; sampling results; system recovery procedures; transient fault scenarios; Circuit faults; Clocks; Latches; Redundancy; Registers; Timing; Transient analysis; Circuit and system radiation hardening and mitigation; concurrent error detection schemes; fault attacks; soft errors; transient faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131361
Filename :
6131361
Link To Document :
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