Title :
Evaluation on protective single event burnout test method for power DMOSFETs
Author :
Liu, Sandra ; Marec, Ronan ; Sherman, Phillip ; Titus, Jeffrey L. ; Bezerra, Françoise ; Ferlet-Cavrois, Veronique ; Marin, Marc ; Sukhaseum, Nicolas ; Widmer, Fabien ; Muschitiello, Michele ; Gouyet, Lionel ; Ecoffet, Robert ; Zafrani, Max
Author_Institution :
Int. Rectifier Corp., El Segundo, CA, USA
Abstract :
This paper evaluates protective single event burnout test method on power DMOSFETs to confirm that it provides accurate test results as the destructive test method when performed properly. The selection of resistor values, protective mechanism, and considerations in calculating SEB cross-section are discussed.
Keywords :
power MOSFET; resistors; SEB cross-section; destructive test method; power DMOSFET; protective single event burnout test method; resistor value selection; Electronic mail; MOSFET circuits; Resistors; Silver; Threshold voltage; Transient analysis; Xenon; Nondestructive; Power MOSFET; Single Event Burnout; Test Method;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131364
