Title :
Irradiance-dependence and translation of the I-V characteristics of crystalline silicon solar cells
Author :
Hishikawa, Yoshihiro ; Imura, Yuma ; Oshiro, Toshimitsu
Author_Institution :
Japan Quality Assurance Organ., Shizuoka, Japan
Abstract :
The current-voltage characteristics Iout(V) of crystalline silicon (c-Si) solar cells are experimentally investigated at various irradiance E. Its dependence on E can be well approximated by the sum of a dark current and a voltage-dependent “photocurrent”, which is proportional to E. These results are used to develop translation equations. It is demonstrated that the resulting formula is able to calculate the Iout(V) of c-Si solar cells at any E from experimental Iout(V) at two different Es, with comparable or better accuracy than the conventional procedure based on the shifted approximation. The present procedure is straightforward, and does not require correction for the series resistance. The same procedure is valid for various solar cells including a-Si, thin-film crystalline silicon, and CdTe
Keywords :
electric current measurement; elemental semiconductors; semiconductor device measurement; semiconductor device testing; silicon; solar cells; voltage measurement; I-V characteristics; Si; c-Si solar cells; crystalline silicon solar cells; current-voltage characteristics; dark current; irradiance; translation equations; voltage-dependent photocurrent; Amorphous silicon; Cadmium compounds; Crystallization; Current-voltage characteristics; Dark current; Equations; Photovoltaic cells; Quality assurance; Semiconductor thin films; Voltage;
Conference_Titel :
Photovoltaic Specialists Conference, 2000. Conference Record of the Twenty-Eighth IEEE
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-5772-8
DOI :
10.1109/PVSC.2000.916169