• DocumentCode
    3034022
  • Title

    Single event effects in the high-input voltage DC/DC converter for aerospace applications

  • Author

    Wang, Wenyan ; Yu, Qingkui ; Meng, Meng ; Li, Pengwei ; Tang, Min

  • Author_Institution
    China Acad. of Space Technol., Beijing, China
  • fYear
    2011
  • fDate
    19-23 Sept. 2011
  • Firstpage
    266
  • Lastpage
    269
  • Abstract
    Historically, spacecraft power system nominal bus voltages have been increasing over time to accommodate increasing bus load demands while reducing spacecraft mass, particularly in electrical harnesses. The use of higher nominal spacecraft bus voltages requires higher rated circuit protection devices as well as a thorough understanding of power system dynamics during fault clearing events. In this paper, we analyzed the operating principles of the high-input voltage DC/DC converters. The single-event transients and single-event function failures of the DC/DC converters are evaluated for aerospace applications by experiments. The result indicates that the power MOSFETs of the high voltage bus DC/DC converters need to pay special attention for the single-event effects.
  • Keywords
    DC-DC power convertors; aerospace; aircraft power systems; power MOSFET; power system faults; space vehicles; aerospace application; bus load demand; fault clearing event; high-input voltage bus DC-DC converter; higher rated circuit protection device; power MOSFET; single-event function failure effect; single-event transient failure effect; spacecraft bus voltage; spacecraft power system dynamic; DC-DC power converters; MOSFETs; Pulse width modulation; Radiation effects; Space technology; Space vehicles; Transient analysis; DC/DC converter; High-input voltage; single-event function failure; single-event transient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
  • Conference_Location
    Sevilla
  • ISSN
    0379-6566
  • Print_ISBN
    978-1-4577-0585-4
  • Type

    conf

  • DOI
    10.1109/RADECS.2011.6131406
  • Filename
    6131406