DocumentCode :
3034022
Title :
Single event effects in the high-input voltage DC/DC converter for aerospace applications
Author :
Wang, Wenyan ; Yu, Qingkui ; Meng, Meng ; Li, Pengwei ; Tang, Min
Author_Institution :
China Acad. of Space Technol., Beijing, China
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
266
Lastpage :
269
Abstract :
Historically, spacecraft power system nominal bus voltages have been increasing over time to accommodate increasing bus load demands while reducing spacecraft mass, particularly in electrical harnesses. The use of higher nominal spacecraft bus voltages requires higher rated circuit protection devices as well as a thorough understanding of power system dynamics during fault clearing events. In this paper, we analyzed the operating principles of the high-input voltage DC/DC converters. The single-event transients and single-event function failures of the DC/DC converters are evaluated for aerospace applications by experiments. The result indicates that the power MOSFETs of the high voltage bus DC/DC converters need to pay special attention for the single-event effects.
Keywords :
DC-DC power convertors; aerospace; aircraft power systems; power MOSFET; power system faults; space vehicles; aerospace application; bus load demand; fault clearing event; high-input voltage bus DC-DC converter; higher rated circuit protection device; power MOSFET; single-event function failure effect; single-event transient failure effect; spacecraft bus voltage; spacecraft power system dynamic; DC-DC power converters; MOSFETs; Pulse width modulation; Radiation effects; Space technology; Space vehicles; Transient analysis; DC/DC converter; High-input voltage; single-event function failure; single-event transient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131406
Filename :
6131406
Link To Document :
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