DocumentCode :
3034032
Title :
Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier
Author :
Perez, S. ; Dusseau, L. ; Velo, Y. Gonzalez ; Vaillé, J-R ; Boch, J. ; Saigné, F. ; Bezerra, F. ; Ecoffet, R.
fYear :
2011
fDate :
19-23 Sept. 2011
Firstpage :
270
Lastpage :
273
Abstract :
The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with 60Co source is investigated. The positive input current and the output voltage present an erratic behavior, that may differ from sample to sample. Circuit analysis is conducted in order to determine the degradation mechanisms.
Keywords :
feedback amplifiers; radiation hardening (electronics); AD844; TID; circuit analysis; circuit effects; current feedback amplifier; erratic degradation; total ionizing dose; Degradation; Feedback amplifier; Impedance; Mirrors; Performance evaluation; Radiation effects; Transistors; 60Co; Current feedback amplifier; Total Ionizing Dose; bipolar ICs; current conveyor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
ISSN :
0379-6566
Print_ISBN :
978-1-4577-0585-4
Type :
conf
DOI :
10.1109/RADECS.2011.6131407
Filename :
6131407
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3034032
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