DocumentCode
303411
Title
Statistical risk analysis for classification and feature extraction by multilayer perceptrons
Author
Chatterjee, Chanchal ; Roychowdhury, Vwani
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
3
fYear
1996
fDate
3-6 Jun 1996
Firstpage
1610
Abstract
We investigate the training of multilayer perceptrons with the commonly used mean square error (MSE) criterion, and demonstrate a number of novel connections between the neural network operations and the Bayes risk analysis, Although previous research shows a number of connections from seemingly different criteria, we establish a common statistical framework to derive a generalized version of most, if not all, of these results, and also present several new results. We discuss the following: (1) We present two equivalent cost functions, and show that the MSE at the network output is equivalent to these cost functions for large samples. (2) We show that if the network performs a weighted classification, then the network output estimates the conditional risk. (3) We next show that if the final layer of the network is linear, then minimizing the MSE at the output, also maximizes a generalized criterion for nonlinear discriminant analysis (NDA). (4) We show that for a network with linear output layer, the outputs sum to one, and behave like probabilities. This new result allows us to estimate conditional risks at the network output, and also perform NDA at the final hidden layer. (5) Results for the uniform costs show that the MSE at the output is a tight upper bound of the error probability of the Bayes decision rule
Keywords
Bayes methods; feature extraction; learning (artificial intelligence); least mean squares methods; multilayer perceptrons; pattern classification; statistical analysis; Bayes decision rule; Bayes risk analysis; MSE; NDA; classification; equivalent cost functions; error probability; feature extraction; mean square error criterion; mean square error minimization; multilayer perceptrons; nonlinear discriminant analysis; probabilities; statistical framework; statistical risk analysis; tight upper bound; weighted classification; Cost function; Error probability; Feature extraction; Mean square error methods; Multi-layer neural network; Multilayer perceptrons; Neural networks; Performance analysis; Risk analysis; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1996., IEEE International Conference on
Conference_Location
Washington, DC
Print_ISBN
0-7803-3210-5
Type
conf
DOI
10.1109/ICNN.1996.549141
Filename
549141
Link To Document