Title :
A New Model for Open-Ended Dielectric Sensors
Author :
Stuchly, S.S. ; Sibbald, C.L.
Author_Institution :
Department of Electrical and Computer Engineering, University of Victoria, Canada
Keywords :
Admittance; Apertures; Coaxial components; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Moment methods; Permittivity measurement; Probes;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672174
