A simple method for extreme impedances measurement - experimental testing

This paper directly follows and extends, where a novel method for measurement of extreme impedances is described theoretically. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer (VNA) the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kOmega up to 330 kOmega. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values.