Title :
Characterization of SEFI events on the EDODRAM used in large space solid state memory
Author :
Mazurek, M. ; Grandjean, M. ; Lochon, F. ; Guerre, FX ; Standarovski, D. ; Dangla, D. ; Damery, JC
Abstract :
This paper details the results of a heavy ion test carried-out on a 64Mb EDODRAM memory from Micron. During this study, a correlation between current steps and SEFI events will be established. Finally, a software strategy for replacing an obsolete device without a strong impact of the design will be proposed.
Keywords :
DRAM chips; Micron EDODRAM memory; SEFI events; large space solid state memory; software strategy; Graphical user interfaces; Ion sources; Monitoring; Performance evaluation; Software; Xenon;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131419
