Title :
Local laser irradiation technique for SEE testing of ICs
Author :
Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Savchenkov, Dmitry V. ; Tararaksin, Alexander S. ; Vasil´ev, Alexey L. ; Yanenko, Andrey V.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
The results of local laser simulation for estimation of SEE parameters are presented. Simulation method is based on the local laser irradiation of VLSI by measuring response in power supply circuits and determining laser threshold energy of SEE.
Keywords :
VLSI; integrated circuit testing; measurement by laser beam; power supply circuits; radiation effects; IC SEE testing; SEE parameter estimation; VLSI simulation method; local laser irradiation technique; local laser simulation; measurement by laser beam; power supply circuits; Laser modes; Measurement by laser beam; Radiation effects; Semiconductor lasers; Very large scale integration; measurement by laser beam; radiation effects; very large scale integration;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on
Conference_Location :
Sevilla
Print_ISBN :
978-1-4577-0585-4
DOI :
10.1109/RADECS.2011.6131420
