Title :
Simultaneous measurement of high and low frequency response of non-linear microwave circuits
Author :
Avolio, G. ; Pailloncy, G. ; Schreurs, D. ; Bossche, Marc ; Nauwelaers, B.
Author_Institution :
Div. ESAT-TELEMIC, K.U.Leuven, Leuven
Abstract :
In this work, measurements of the high frequency as well as the low frequency response of a non-linear microwave circuit are reported. The developed set-up is based on an extension of the LSNA and it enables the simultaneous measurement of baseband response and RF behaviour. Thanks to this capability a direct correlation between the variation of baseband impedance and asymmetry of distortion components around the fundamental carrier is possible. Experimental results of two-tone measurements, carried out on a hybrid GaAs microwave circuit, are shown.
Keywords :
III-V semiconductors; circuit testing; frequency response; gallium arsenide; microwave circuits; microwave measurement; nonlinear network analysis; GaAs; LSNA extension; baseband impedance; distortion components; high-frequency response measurement; low-frequency response measurement; nonlinear hybrid microwave circuits; two-tone measurement; Baseband; Distortion measurement; Frequency measurement; Frequency response; Gallium arsenide; Impedance; Microwave circuits; Microwave measurements; Nonlinear distortion; Radio frequency;
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
DOI :
10.1109/ARFTG.2008.4804281
