• DocumentCode
    3034413
  • Title

    Simultaneous measurement of high and low frequency response of non-linear microwave circuits

  • Author

    Avolio, G. ; Pailloncy, G. ; Schreurs, D. ; Bossche, Marc ; Nauwelaers, B.

  • Author_Institution
    Div. ESAT-TELEMIC, K.U.Leuven, Leuven
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    In this work, measurements of the high frequency as well as the low frequency response of a non-linear microwave circuit are reported. The developed set-up is based on an extension of the LSNA and it enables the simultaneous measurement of baseband response and RF behaviour. Thanks to this capability a direct correlation between the variation of baseband impedance and asymmetry of distortion components around the fundamental carrier is possible. Experimental results of two-tone measurements, carried out on a hybrid GaAs microwave circuit, are shown.
  • Keywords
    III-V semiconductors; circuit testing; frequency response; gallium arsenide; microwave circuits; microwave measurement; nonlinear network analysis; GaAs; LSNA extension; baseband impedance; distortion components; high-frequency response measurement; low-frequency response measurement; nonlinear hybrid microwave circuits; two-tone measurement; Baseband; Distortion measurement; Frequency measurement; Frequency response; Gallium arsenide; Impedance; Microwave circuits; Microwave measurements; Nonlinear distortion; Radio frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Symposium, 2008 72nd ARFTG
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-4244-2300-2
  • Electronic_ISBN
    978-1-4244-2300-2
  • Type

    conf

  • DOI
    10.1109/ARFTG.2008.4804281
  • Filename
    4804281