Title :
Traceability of vector network analyzer measurements
Author_Institution :
Agilent Technol., Inc., Santa Rosa, CA
Abstract :
Measurement traceability is NOT just a requirement in ISO quality standards. It is a necessity to ensure the accuracy of any measurement system. For vector network analyzers (VNA), the traceability of S-parameter measurements is not obvious. The latest generation of VNA is also capable of making measurements beyond S-parameters. This paper will present the latest developments in VNA measurement traceability chain, the key traceable parameters, calibration and verification standard traceability and some verification techniques and results.
Keywords :
S-parameters; calibration; measurement standards; network analysers; ISO quality standard measurement system; S-parameter measurement; VNA measurement traceability; calibration; vector network analyzer; Calibration; Coaxial components; Connectors; Frequency measurement; Impedance measurement; Measurement standards; Measurement uncertainty; Metrology; Noise measurement; Scattering parameters;
Conference_Titel :
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-2300-2
Electronic_ISBN :
978-1-4244-2300-2
DOI :
10.1109/ARFTG.2008.4804283
