DocumentCode
3034451
Title
Traceability of vector network analyzer measurements
Author
Wong, Ken
Author_Institution
Agilent Technol., Inc., Santa Rosa, CA
fYear
2008
fDate
9-12 Dec. 2008
Firstpage
157
Lastpage
167
Abstract
Measurement traceability is NOT just a requirement in ISO quality standards. It is a necessity to ensure the accuracy of any measurement system. For vector network analyzers (VNA), the traceability of S-parameter measurements is not obvious. The latest generation of VNA is also capable of making measurements beyond S-parameters. This paper will present the latest developments in VNA measurement traceability chain, the key traceable parameters, calibration and verification standard traceability and some verification techniques and results.
Keywords
S-parameters; calibration; measurement standards; network analysers; ISO quality standard measurement system; S-parameter measurement; VNA measurement traceability; calibration; vector network analyzer; Calibration; Coaxial components; Connectors; Frequency measurement; Impedance measurement; Measurement standards; Measurement uncertainty; Metrology; Noise measurement; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Symposium, 2008 72nd ARFTG
Conference_Location
Portland, OR
Print_ISBN
978-1-4244-2300-2
Electronic_ISBN
978-1-4244-2300-2
Type
conf
DOI
10.1109/ARFTG.2008.4804283
Filename
4804283
Link To Document