Title :
Development of an optical method for the detection of small quantities of contaminants in SF6
Author :
St-Arnaud, J.M. ; Bose, T.K. ; Fréchette, M.F.
Author_Institution :
Dept. de Phys., Quebec Univ., Trois-Rivieres, Que., Canada
Abstract :
A differential interferometric method has been developed to measure small quantities of gaseous contaminants in SF6. Experimental results are given for the mixtures 4900 and 10500 ppmv of CO2 in SF6 up to 0.6 MPa at 298.15 K
Keywords :
SF6 insulation; electric breakdown; insulation testing; interferometry; 0.6 MPa; 298.15 K; CO2; SF6; SF6 gas insulation; differential interferometric method; gaseous contaminants; gaseous dielectrics; insulation breakdown tests; optical test method; Diffraction; Gratings; Laser beams; Optical interferometry; Optical polarization; Optical refraction; Optical variables control; Pollution measurement; Pressure measurement; Sulfur hexafluoride;
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-3531-7
DOI :
10.1109/ELINSL.1996.549296
